Quality Control Policy

It is C&H Machining policy to provide our customers with quality product and delivery performance that meets or exceeds their specified requirements. In doing so, the company will achieve continual growth and profitability, along with recognition as a world-class supplier of machined parts and assemblies.
 

We are committed in our approach towards the achievement of customer satisfaction through the establishment of this Quality Management System. The implementation, maintenance and continual improvement of the Quality Management System is achieved by assuring all employees understand and follow the requirements of our Quality Management System and are provided with the resources necessary.

Quality Control Systems

  • AS9100C QUALITY MANAGEMENT SYSTEM

  • AZ540.3 CALIBRATION PROCEDURES AND REQUIREMENTS

  • N.I.S.T. TRACEABILITIES

  • GAGEPACK CALIBRATION SOFTWARE

  • QUALITY CONTROL MANUAL FURNISHED UPON REQUEST

  • AS9102 FIRST ARTICILE INSPECTIONS

  • LISTED ON OASIS DATA BASE

  • EMPHASIS ON LEAN TECHNIQUES

  • ITAR REGISTERED

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Inspection Equipment

  • CMM MICRO-HITE with REFLEX SOFTWARE 18" x 20" x 16½" TABLE

  • TESA-HITE 400 HEIGHTSTAND 16" TRAVEL   .0001" ACCURACY

  • 2 MITUTOYO HEIGHTSTANDS with 0" - 18"  .001 accuracy

  • DEPTH MICROMETERS  0" - 6"

  • INSPECTION BLOCKS

  • VERNIER CALIPERS 0" - 40"

  • SET OF MASTER GAGE BLOCKS (tracerable to nist )

  • PIN GAGES FROM .011" TO 1.000" .001" INCREMENTS

  • MITUTOYO DIAL BORE GAGES .280" - 2.400"  .0001" INCREMENTS

  • DELTRONICS PIN GAGES .0001" INCREMENTS

  • STANDARD THREAD GAGES

  • 14" OPTICAL COMPARATOR 10x power, .0005" increments with overlays

  • STARRETT GRANITE SURFACE PLATES

  • 5" x 5" SINE PLATE

  • 1 STARRETT INSPECTION SURFACE PLATE 2' x 3'

  • 2 SUPER BENCH MICROMETERS

  • ALL OTHER STANDARD INSPECTION EQUIPMENT 

  • IM Series Image Dimension Measurement System??

  • With optical comparators and measuring microscopes, an operator moves the XY stage, obtains the coordinates of the measurement point, and measures dimensions based on the travel range. Since the stage needs to be moved for each measurement point, measuring can become a long and tedious process.

  • The IM Series Instant Measurement System extracts measurement points with a large diameter lens and a specially designed CMOS camera. It can measure up to 99 points simultaneously and significantly reduce measurement time.

  • Unlike optical comparators and measuring microscopes, the IM Series uses pattern matching. As a result, the measurements do not depend on human vision and the result is consistent regardless of the operator.